Major capability parameter | |||
Crystal structure |
M4 | ||
Growth method |
Czochralski method | ||
AtomsDensity |
~1.37x1020atoms/cm3 | ||
Unit cell constant |
a=b=7.12 Å, c=6.29 Å | ||
Density |
4.22(g/cm3) | ||
Hardness |
5(mohs)(similar with glass) | ||
Melt point |
1825℃ | ||
Thermal conductivity |
A=5.32(w/mk)C=5.10(w/mk) | ||
Denko coefficient |
dna/dT=8.5×10-6/k;dnc/dT=3.0×10-6/k | ||
Thermal expansion |
aa=4.43x10-6/K ac=11.37x1010-6/K | ||
Spectral range |
0.45—5µm | ||
(λ:μm) |
ne2=3.77843+0.069736/(λ2 -0.04724)-0.0108133λ2
ne2=4.55905+0.110534/(λ2 -0.04813)-0.0122676λ2 | ||
n \ wavelength |
0.63µm |
1.30µm |
1.55µm |
Index of refraction no |
1.9929 |
1.9500 |
1.9447 |
Index of refraction ne |
2.22154 |
2.1554 |
2.1486 |
(△n=ne-no) |
0.2225 |
0.2054 |
0.2039 |
晶棒<001>±0.5º |
Φ25mm×25mm | ||
θ=0/45 º Φ=0/45 º |
2×2×7mm、4×4×7.5mm
| ||
AR |
R<0.25% (1550nm) | ||
Polishing |
Single or double | ||
Pack |
100 clean bag,1000 exactly clean bag |